Dimitrios Alanis |
Apple, Germany |
Dimitrios Alanis |
Michele Amoretti |
University of Parma, Italy |
Michele Amoretti |
Zunaira Babar |
University of Southampton, United Kingdom (Great Britain) |
Zunaira Babar |
Laszlo Bacsardi |
Budapest University of Technology and Economics, Hungary |
Laszlo Bacsardi |
Michel Barbeau |
Carleton University, Canada |
Michel Barbeau |
Panagiotis Botsinis |
Apple Technology Engineering, Germany |
Panagiotis Botsinis |
Marco Chiani |
University of Bologna, Italy |
Marco Chiani |
Andrea Conti |
DE and CNIT, University of Ferrara, Italy |
Andrea Conti |
Wenhan Dai |
University of Massachusetts Amherst & Radix Trading LLC, USA |
Wenhan Dai |
Ivo Degiovanni |
Istituto Nazionale di Ricerca Metrologica, Italy |
Ivo Degiovanni |
Shayan Garani |
Indian Institute of Science, Bangalore, India |
Shayan Garani |
Marco Gramegna |
INRIM, Italy |
Marco Gramegna |
Lajos Hanzo |
University of Southampton, United Kingdom (Great Britain) |
Lajos Hanzo |
Sándor Imre |
Technical University of Budapest, Hungary |
Sándor Imre |
Ramoshweu Solomon Lebelo |
Vaal University of Technology, South Africa |
Ramoshweu Solomon Lebelo |
Vinod Mishra |
ARL, USA |
Vinod Mishra |
Peter Mueller |
IBM Zurich Research Laboratory, Switzerland |
Peter Mueller |
Soon Xin Ng |
University of Southampton, United Kingdom (Great Britain) |
Soon Xin Ng |
Alexandru Paler |
Aalto University, Austria |
Alexandru Paler |
Joaquin Perez |
Universitat de Valencia, Spain |
Joaquin Perez |
Mohsen Razavi |
University of Leeds, United Kingdom (Great Britain) |
Mohsen Razavi |
Liangzhong Ruan |
Massachusetts Institute of Technology, USA |
Liangzhong Ruan |
Aleksandar Stojanovic |
IT Portugal, Portugal |
Aleksandar Stojanovic |
Rodney Van Meter |
Keio University, Japan |
Rodney Van Meter |