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Other reviewers

  • Hadeel Alhosaini, University of Jeddah, Saudi Arabia
  • Saleh M Alqahtani, Saudi Electronic University, Saudi Arabia
  • Ohood Alrohili, Taibah University, Saudi Arabia
  • Yazeed Alzahrani, Prince Sattam Bin Abdulaziz University, Saudi Arabia
  • Haitham Assiri, Jazan University, Saudi Arabia
  • Anjan Bandyopadhyay, Kalinga Institute of Industrial Technology, India
  • Susnata Bhattacharya, CQUniversity, Australia
  • Osama Dighriri, Sr., Jazan University, Saudi Arabia
  • Raddad H Faqihi, Saudi Electronic University, Saudi Arabia
  • Clementine Griti, INSA Lyon, France
  • Leena Jenefa, Hindustan Institute of Technology and Science, India
  • Rajath Karangara, Intraedge, USA
  • Anmol Kumar, Indian Institute of Technology Patna, India
  • Deepak Kumar, University of the Cumberlands, USA
  • Asish B Mathews, Principal, Travancore Engineering College, Oyur, India
  • Valeriy Osipyan, Kuban State University, Russia
  • Sujata Pal, Indian Institute of Technology Ropar, India
  • Shouthiri Partheepan, Central Queensland University, Australia
  • Khaled Shaban, Saudi Electronic University, Saudi Arabia
  • Priyanka Singh, The University of Queensland, Australia
  • Vikash Kumar Singh, VIT-AP University, India
  • Ajay Lotan Thakur, Intel Corp Canada, Canada
  • Tugkan Tuglular, Izmir Institute Of Technology, Turkey
  • Muthukumaran Vaithianathan, Samsung Semiconductor Inc., USA
  • Zhenglin Wang, Central Queensland University, Australia