A Meta Heuristic Search based T-way Event Driven Input Sequence Test Case Generator

Md Mostafijur Rahman (Daffodil International University (DIU), Bangladesh); Rozmie Razif Othman (Universiti Malaysia Perlis, Malaysia); Badlishah R Ahmad (Universiti Sultan Zainal Abidin (UniSZA), Malaysia); Md Mijanur Rahman (Universiti Malaysia Perlis, Malaysia)

Exhaustive testing for event driven sequence input interaction is costly and not always practicable for all types of software testing. So, an alternative technique is crucial where optimum/near optimum test case generation is key concern. This paper presents a feasible test suite generation technique using a meta heuristic search called Simulated Annealing (SA) for T-way Event Driven Input Sequence Test Case (EDISTC) Generator and abbreviated as T-way EDISTC-SA generator. The T-way EDISTC-SA technique focuses on a heuristic analysis for generating feasible and near optimum test suite(s), where a cost function carefully initiates acceptable test input sequences and a fine-tuned cooling rate with temperature takes part as an iterative perspective. We corroborate on EDISTC-SA algorithm by doing a number of experiments to achieve optimum and/or near optimum test cases from a number of test input sequences. The experimental results are tested on a real application called Embedded Network Traffic Monitoring System (ENTM). Analysis on EDISTC-SA strategy shows that the optimum test suite is found from some of the iterated solution and there is possibility to have more feasible accepted test suites.

Journal: International Journal of Simulation- Systems, Science and Technology- IJSSST V15

Published: Jun 30, 2014

DOI: 10.5013/IJSSST.a.15.03.10