Technical Program Committee

Elaheh Ahmadi University of Michigan, USA Elaheh Ahmadi
Tim Ashley University of Warwick, United Kingdom (Great Britain) Tim Ashley
Matthias Batzill University of South Florida, USA Matthias Batzill
Kris Bertness National Institute of Standards and Technology, USA Kris Bertness
Oliver Bierwagen Paul-Drude-Institut für Festkörperelektronik, Germany Oliver Bierwagen
Emily Bittle National Institutute of Standards and Technology, USA Emily Bittle
Linyou Cao NCSU, USA Linyou Cao
Kevin Chen Hong Kong University of Science and Technology, Hong Kong Kevin Chen
Srabanti Chowdhury UC Davis & ASU, USA Srabanti Chowdhury
Eduardo Chumbes Raytheon, USA Eduardo Chumbes
Volker Daumer Fraunhofer IAF, Germany Volker Daumer
Holger Eisele Technische Universität Berlin, Germany Holger Eisele
Randall Feenstra Carnegie Mellon University Pittsburgh, USA Randall Feenstra
Daniel Feezell Center for High Technology Materials, University of New Mexico, USA Daniel Feezell
Aaron D Franklin Duke University, USA Aaron D Franklin
Shizuo Fujita Kyoto University, Japan Shizuo Fujita
Zbigniew Galazka Leibniz Institute for Crystal Growth - IKZ, Germany Zbigniew Galazka
Lutz Geelhaar Paul-Drude-Institut für Festkörperelektronik, Germany Lutz Geelhaar
Chris Giebink The Pennsylvania State University, USA Chris Giebink
Sarath Gunapala NASA Jet Propulsion Laboratory & California Institute of Technology, USA Sarath Gunapala
David Gundlach National Institute of Standards and Technology, USA David Gundlach
James Gupta Institute for Microstructural Sciences, National Research Council of Canada, Canada James Gupta
Nazila Haraitpour Intel Corporation, USA Nazila Haraitpour
Masataka Higashiwaki National Institute of Information and Communications Technology, Japan Masataka Higashiwaki
Hideki Hirayama Japan Hideki Hirayama
Debdeep Jena Cornell University, USA Debdeep Jena
Gregg Jessen Air Force Research Laboratory, USA Gregg Jessen
Oana Jurchescu Wake Forest, USA Oana Jurchescu
Roland Kawakami OSU, USA Roland Kawakami
Jacob Khurgin The Johns Hopkins University, USA Jacob Khurgin
Steven Koester University of Minnesota, USA Steven Koester
Takaaki Koga Hokkaido University, Japan Takaaki Koga
Ioannis Kymissis Columbia University, USA Ioannis Kymissis
Xiuling Li University of Texas at Austin, USA Xiuling Li
Amy W. K. Liu IQE Inc., USA Amy W. K. Liu
Tony Low University of Minnesota, USA Tony Low
Kozo Makiyama Fujitsu Laboratories Ltd., Japan Kozo Makiyama
Ermin Malic Chalmers University of Technology, Sweden Ermin Malic
Elison Matioli EPFL, Switzerland Elison Matioli
Luke Mawst University of Wisconsin-Madison, USA Luke Mawst
Gerry Mei Northrop Grumman Corporation, USA Gerry Mei
Jerry Meyer Naval Research Laboratory, USA Jerry Meyer
Zetian Mi University of Michigan, USA Zetian Mi
Eva Monroy CEA-Grenoble, France Eva Monroy
Roberto Paiella Boston University, USA Roberto Paiella
Tomas Palacios Massachusetts Institute of Technology, USA Tomas Palacios
Sameer Pendharkar Texas Instruments, Germany Sameer Pendharkar
Rüdiger Quay Fraunhofer IAF, Germany Rüdiger Quay
Farhan Rana Cornell University, USA Farhan Rana
Petra Reinke University of Virginia, USA Petra Reinke
Stefano Sanguinetti Università di Milano-Bicocca, Italy Stefano Sanguinetti
Michael Santos University of Oklahoma, USA Michael Santos
Andre Schleife University of Illinois, Urbana-Champaign, USA Andre Schleife
Woongje Sung SUNY Poly, USA Woongje Sung
Marko Tadjer Naval Research Laboratory, USA Marko Tadjer
Nelson Tansu Lehigh University, USA Nelson Tansu
Rainer Timm Lund University, Sweden Rainer Timm
Katsuhiro Tomioka Hokkaido University, Japan Katsuhiro Tomioka
Tom Tsai TSMC, Taiwan Tom Tsai
Shiro Tsukamoto National Institute of Technology, Anan College, Japan Shiro Tsukamoto
Miguel Urteaga Teledyne, USA Miguel Urteaga
Miguel Urteaga Teledyne Scientific & Imaging LLC, USA Miguel Urteaga
Andreas Waag TU Braunschweig, Germany Andreas Waag
Tao Wang University of Sheffield, USA Tao Wang
Xinqiang Wang Peking Unversity, China Xinqiang Wang
Nils Weimann University of Duisburg-Essen, Germany Nils Weimann
Huili Xing Cornell University, USA Huili Xing
Hongqi Xu Beijing Key Laboratory of Quantum Devices, Peking University, China Hongqi Xu
Euijoon Yoon Seoun National University, Korea (South) Euijoon Yoon
Yong-hang Zhang Arizona State University, USA Yong-hang Zhang
Ahmad Zubair Massachusetts Institute of Technology, USA Ahmad Zubair
Val Zwiller KTH Stockholm, Sweden Val Zwiller